ENHANCED MODEL TO HANDLE DATA SENSITIVITY FOR CROP YIELD PREDICTION USING MACHINE LEARNING TECHNIQUES. JOURNAL OF BASIC SCIENCE AND ENGINEERING, [S. l.], v. 20, n. 1, p. 69–76, 2023. Disponível em: https://yigkx.org.cn/index.php/jbse/article/view/219.. Acesso em: 20 sep. 2024.