ANNEALED TEMPERATURE SOL-GEL DEPOSITED P-CHANNEL TYPE CUXCR1-XO2- Δ THIN FILM TRANSISTORS

Authors

  • P. Sateesh, Yarlagadda Subbarao, Venishetty Sunil Kumar , Hemanth Kumar Narsetti Author
  • K. Ashalatha G. Ramireddy K. Gopinath P. Sivakumar Author

Abstract

Thin-film transistors (TFTs) were created in this study by integrating transparent p-type CuCr 1-xOy semiconductor thin films, which were created using spin coating. (x =0.0≤x≤0.4)) . For P-type thin-film transistors, which are essential parts of printed electronics, Cu-based films offer a low-cost and low-energy manufacturing method. CuCr 1-xO2 thin-film device performance was thoroughly examined, along with its structural and morphological elements and optical characteristics. When the annealing temperature (Ta) exceeded 750ͦ C, the phase transition from a combination of CuCr2O4 and CuO to pure CuCrO2 was achieved. The optimized Cucr1-xo2   TFT has a Resistivity Value about 0.021 Ω cm, an on/off current ratio of 107  and a hole mobility of 0.61 cm2V-1S-1 . The construction and operation of p-Type oxide TFTs are briefly summarized in this study, along with the challenges and advancements in oxide transistor and CMOS logic circuit development.

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Published

2024-07-06

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Articles

How to Cite

ANNEALED TEMPERATURE SOL-GEL DEPOSITED P-CHANNEL TYPE CUXCR1-XO2- Δ THIN FILM TRANSISTORS. (2024). JOURNAL OF BASIC SCIENCE AND ENGINEERING, 21(1), 1480-1493. https://yigkx.org.cn/index.php/jbse/article/view/213